Inspection System for Vehicle Headlight Defects based on Convolutional Neural Network
Paper Title: Inspection System for Vehicle Headlight Defects based on Convolutional Neural Network
Journal Name: Applied Sciences
Abstract: Chang Bae Moon, D.-S. Kim, et. al., Inspection System for Vehicle Headlight Defects based on Convolutional Neural Network, Applied Sciences, Vol. 11, No. 10, 4402, pp. 1-18, May 2021 (IF: 2.474)
Status: Published
Journal Type: International
Cite: Chang Bae Moon, D.-S. Kim, et. al., Inspection System for Vehicle Headlight Defects based on Convolutional Neural Network, Applied Sciences, Vol. 11, No. 10, 4402, pp. 1-18, May 2021 (IF: 2.474)